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Introduction to machine learning with applications in information security / Mark Stamp, San Jose State University, California.

By: Stamp, Mark [author.].
Series: Chapman & Hall/CRC machine learning & pattern recognition ; 16.Publisher: Boca Raton : CRC Press, Taylor & Francis Group, ©2018Description: 345 p: 25 cm.Content type: text Media type: unmediated Carrier type: volumeISBN: 9781138626782 (hardback : acidfree paper).Subject(s): Information networks -- Security measures | Machine learningGenre/Form: Print books.
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Includes bibliographical references (pages 319-337) and index.

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