Cluster secondary ion mass spectrometry : principles and applications / edited by Christine M. Mahoney.
Publisher number: EB00063935 | Recorded BooksSeries: Wiley-Interscience series on mass spectrometryPublication details: Hoboken, New Jersey : Wiley, ©2013.Description: 1 online resource (350 pages)Content type:- text
- computer
- online resource
- 9781118589335
- 1118589335
- 9781118589250
- 1118589254
- 0470886056
- 9780470886052
- 9781299475878
- 1299475876
- 9781118589243
- 1118589246
- QD96.S43 .M34 2013

This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.
Includes bibliographical references and index.
John Wiley and Sons Wiley eBooks