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Cluster secondary ion mass spectrometry : principles and applications / edited by Christine M. Mahoney.

By: Contributor(s): Publisher number: EB00063935 | Recorded BooksSeries: Wiley-Interscience series on mass spectrometryPublication details: Hoboken, New Jersey : Wiley, ©2013.Description: 1 online resource (350 pages)Content type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9781118589335
  • 1118589335
  • 9781118589250
  • 1118589254
  • 0470886056
  • 9780470886052
  • 9781299475878
  • 1299475876
  • 9781118589243
  • 1118589246
Subject(s): Genre/Form: Additional physical formats: Print version:: Cluster secondary ion mass spectrometry.LOC classification:
  • QD96.S43 .M34 2013
Online resources: Summary: This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.
Item type: eBooks
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This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods.

Includes bibliographical references and index.

John Wiley and Sons Wiley eBooks

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