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Advances in imaging and electron physics. Volume 136 / edited by Peter W. Hawkes.

Contributor(s): Series: Advances in imaging and electron physics ; 136.©2005Description: 1 online resource (xv, 333 pages) : illustrationsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 0080458556
  • 9780080458557
  • 0120147785
  • 9780120147786
Subject(s): Genre/Form: Additional physical formats: Print version:: Advances in imaging and electron physics. Volume 136.LOC classification:
  • QC793.5.E62 A38eb vol. 136
Online resources:
Contents:
Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Real and Complex PDE-Based Schemes for Image Sharpening and Enhancement; The S-State Model for Electron Channeling in High-Resolution Electron Microscopy; Measurement of Electric Fields on Object Surface in an Emission Electron Microscope; Index.
Summary: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Item type: eBooks
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Includes bibliographical references and index.

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Print version record.

Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Real and Complex PDE-Based Schemes for Image Sharpening and Enhancement; The S-State Model for Electron Channeling in High-Resolution Electron Microscopy; Measurement of Electric Fields on Object Surface in an Emission Electron Microscope; Index.

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