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Advances in imaging and electron physics. Volume 120 / edited by Peter W. Hawkes.

Contributor(s): Series: Advances in Imaging and Electron Physics 1e, Evolve Resources for Diagnostic Ultrasound 7e, Pass the©2002Description: 1 online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9780080526225
  • 0080526225
  • 0120147629
  • 9780120147625
  • 9780080522241
  • 0080522246
  • 9780080526232
  • 0080526233
Subject(s): Genre/Form: Additional physical formats: Print version:: Advances in Imaging and Electron Physics.LOC classification:
  • QC793.5.E62 A38eb vol. 120
Online resources:
Contents:
Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. A Review of Image Segmentation Techniques Integrating Region and Boundary Information; Chapter 2. Mirror Corrector for Low-Voltage Electron Microscopes; Chapter 3. Characterization of Texture in Scanning Electron Microscope Images; Chapter 4. Degradation Identification and Model Parameter Estimation in Discontinuity-Adaptive Visual Reconstruction; Index.
Summary: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Item type: eBooks
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Title from PDF title page (viewed Sep. 27, 2007).

Includes bibliographical references and indexes.

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. A Review of Image Segmentation Techniques Integrating Region and Boundary Information; Chapter 2. Mirror Corrector for Low-Voltage Electron Microscopes; Chapter 3. Characterization of Texture in Scanning Electron Microscope Images; Chapter 4. Degradation Identification and Model Parameter Estimation in Discontinuity-Adaptive Visual Reconstruction; Index.

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