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Electron microscopy and holography II / edited by Peter W. Hawkes.

Contributor(s): Series: Advances in imaging and electron physics ; v. 122.©2002Description: 1 online resource (xiv, 336 pages) : illustrationsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9780080526232
  • 0080526233
  • 0120147645
  • 9780120147649
Other title:
  • Electron microscopy and holography two
Subject(s): Genre/Form: Additional physical formats: Print version:: Electron microscopy and holography II.LOC classification:
  • QH212.E4 E44 2002eb
  • QC
Online resources:
Contents:
The structure of quasicrystals studies by atomic-scale observations of transmission electron microscopy / Kenji Hiraga. -- Add-on lens attachments for the scanning electron microscope / Anjam Khursheed. -- Electron holography of long-range electrostatic fields / G. Matteucci, G.F. Missiroli, and G. Pozzi. -- Digital image-processing technology useful for scanning electron microscopy and its practical applications / Eisaku Oho.
Summary: Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Item type: eBooks
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Includes bibliographical references and index.

The structure of quasicrystals studies by atomic-scale observations of transmission electron microscopy / Kenji Hiraga. -- Add-on lens attachments for the scanning electron microscope / Anjam Khursheed. -- Electron holography of long-range electrostatic fields / G. Matteucci, G.F. Missiroli, and G. Pozzi. -- Digital image-processing technology useful for scanning electron microscopy and its practical applications / Eisaku Oho.

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Print version record.

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