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Advances in imaging and electron physics. Volume 105 / edited by Peter W. Hawkes.

Contributor(s): Series: Advances in imaging and electron physics©1999Description: 1 online resource (xiii, 416 pages) : illustrationsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9780080577715
  • 0080577717
  • 0120147475
  • 9780120147472
Subject(s): Genre/Form: Additional physical formats: Print version:: Advances in imaging and electron physics. Volume 105.LOC classification:
  • QC793.5.E62 A37eb vol. 105
Online resources:
Contents:
Front Cover; Advances in Imaging and Electron Physics, Volume 105; Copyright Page; Contents; Contributors; Preface; Chapter 1. Near-Sensor Image Processing; I. Introduction; II. A Near-Sensor Image Processor; III. Near-Sensor Image Processing Algorithms; IV. Adaptive Thresholding; V. Variable Sampling Time; VI. Grayscale Morphology; VII. Linear Convolution; VIII. A 2D NSIP Model; IX. Global Operations; X. Feature Extraction; XI. An NSIP System; XII. Sheet-of-Light Range Images; XIII. Conclusion; Acknowledgment; References.
Chapter 2. Digital Image Processing Technology for Scanning Electron MicroscopyI. Introduction; II. Proper Acquisition and Handling of SEM Image; III. Quality Improvement of SEM Images; IV. Image Measurement and Analysis; V. SEM Parameters Measurement; VI. Color SEM Image; VII. Automatic Focusing and Astigmatism Correction; VIII. Remote Control of SEM; IX. Active Image Processing; References; Chapter 3. Design and Performance of Shadow-Mask Color Cathode Ray Tubes; I. Introduction; II. Basic Structure of Shadow-Mask Tube and Principle of Operation; III. Alternative Gun and Screen Arrangements.
IV. Geometric ConsiderationsV. Shadow Masks; VI. Phosphor Materials and Screen Fabrication; VII. Deflection; VIII. Glass Bulbs; IX. Reduction of Screen Curvature and Use of Flat Tension Masks; X. Contrast Enhancement; XI. Moire; XII. Shadow-Mask Tubes for High-Resolution Display Applications; XIII. Human Factors and Health Considerations; XIV. Concluding Remarks; Acknowledgment; Appendix: Some Specifications of Representative Tube Types; References; Chapter 4. Electron Gun Systems for Color Cathode Ray Tubes; I. Historical Introduction.
II. Electron Beam Formation and Factors Limiting Current Density of SpotIII. Electron Gun Designs; IV. Cathodes; V. Techniques for Improving High-Tension Stability; Acknowledgment; References; Index.
Summary: Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Item type: eBooks
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Includes bibliographical references and index.

Print version record.

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Front Cover; Advances in Imaging and Electron Physics, Volume 105; Copyright Page; Contents; Contributors; Preface; Chapter 1. Near-Sensor Image Processing; I. Introduction; II. A Near-Sensor Image Processor; III. Near-Sensor Image Processing Algorithms; IV. Adaptive Thresholding; V. Variable Sampling Time; VI. Grayscale Morphology; VII. Linear Convolution; VIII. A 2D NSIP Model; IX. Global Operations; X. Feature Extraction; XI. An NSIP System; XII. Sheet-of-Light Range Images; XIII. Conclusion; Acknowledgment; References.

Chapter 2. Digital Image Processing Technology for Scanning Electron MicroscopyI. Introduction; II. Proper Acquisition and Handling of SEM Image; III. Quality Improvement of SEM Images; IV. Image Measurement and Analysis; V. SEM Parameters Measurement; VI. Color SEM Image; VII. Automatic Focusing and Astigmatism Correction; VIII. Remote Control of SEM; IX. Active Image Processing; References; Chapter 3. Design and Performance of Shadow-Mask Color Cathode Ray Tubes; I. Introduction; II. Basic Structure of Shadow-Mask Tube and Principle of Operation; III. Alternative Gun and Screen Arrangements.

IV. Geometric ConsiderationsV. Shadow Masks; VI. Phosphor Materials and Screen Fabrication; VII. Deflection; VIII. Glass Bulbs; IX. Reduction of Screen Curvature and Use of Flat Tension Masks; X. Contrast Enhancement; XI. Moire; XII. Shadow-Mask Tubes for High-Resolution Display Applications; XIII. Human Factors and Health Considerations; XIV. Concluding Remarks; Acknowledgment; Appendix: Some Specifications of Representative Tube Types; References; Chapter 4. Electron Gun Systems for Color Cathode Ray Tubes; I. Historical Introduction.

II. Electron Beam Formation and Factors Limiting Current Density of SpotIII. Electron Gun Designs; IV. Cathodes; V. Techniques for Improving High-Tension Stability; Acknowledgment; References; Index.

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