Includes bibliographical references at the end of each chapters and index.

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading authorities Informs and updates on all the latest developments in the field.

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Machine generated contents note: 1. Utilizing the Eigen-Emittance Concept for Bright Electron Beams / Alex J. Dragt -- 1. Introduction -- 2. Theory -- 3. Construction of Initial Distributions -- 4. Applications to Bright Electron Beams -- 5. Summary and Discussion -- References -- 2. Analytical Methods for the Calculation and Simulation of New Schemes of Static and Time-of-Flight Mass Spectrometers / Igor Spivak-Lavrov -- 1. Introduction -- 2. Analytical Equations for Calculating the Dynamics of the Charged Particle Beam and Their General Properties -- 3. Analytical Methods of Calculating 2D Fields and Fields Reduced to the 2D Ones -- 4. Numerical Calculation of Instrument Characteristics of Static and TOF Mass Spectrometers -- 5. Summary and Conclusions.

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