TY  - BOOK
ED  - International Symposium for Testing and Failure Analysis
ED  - ebrary, Inc.
ED  - ASM International.
TI  - ISTFA '96: proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California
SN  - 9780871705826
AV  - TK7871 .I58 1996eb
PY  - 1996///
CY  - Materials Park, Ohio
PB  - ASM International
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Congresses
KW  - Electronic apparatus and appliances
KW  - Electronic books
KW  - local
N1  - Electronic reproduction; Palo Alto, Calif.; ebrary; 2013; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://ezproxy.alfaisal.edu/login?url=http://site.ebrary.com/lib/alfaisal/Doc?id=10323517
ER  -