Ker, Ming-Dou. <br/><br/>
Transient-induced latchup in CMOS integrated circuits  [electronic resource] / 
Ming-Dou Ker and Sheng-Fu Hsu. 
 - Singapore ;  Hoboken, NJ :  Wiley,  c2009. 
 - xiii, 249 p. :  ill. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2009. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>9780470824078 (cloth) 
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complementary--Defects.<br/>Metal oxide semiconductors, Complementary--Reliability.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7871.99.M44  / K47 2009eb