TY  - BOOK
AU  - Xanthopoulos,Thucydides
ED  - SpringerLink (Online service)
TI  - Clocking in Modern VLSI Systems
T2  - Integrated Circuits and Systems,
SN  - 9781441902610
AV  - TK7888.4 
U1  - 621.3815 23
PY  - 2009///
CY  - Boston, MA
PB  - Springer US
KW  - Engineering
KW  - Computer-aided engineering
KW  - Electrical engineering
KW  - Electronic circuits
KW  - Circuits and Systems
KW  - Electrical Engineering
KW  - Computer-Aided Engineering (CAD, CAE) and Design
KW  - Electronic books
KW  - local
N1  - and Overview -- Modern Clock Distribution Systems -- Clocked Elements -- Exploiting Inductance -- Phase Noise and Jitter -- Digital Delay Lock Techniques -- Clocking and Variation -- Physical Design Considerations
N2  - Clocking in Modern VLSI Systems covers a wide range of subjects related to microprocessor clocking including distribution, flop design, inductive techniques, phase noise and jitter, delay lock techniques, resiliency and other techniques to address process variation and physical design aspects. The book contains rigorous analytical treatment for a number of important topics such as timing uncertainty due statistical spatial and temporal phenomena, metastability, jitter in the time and frequency domain and supply-induced clock noise. It also contains a large number of design examples and case studies, background information, a complete list of references and a number of advanced topics. The subjects covered reflect to a large extent the collective interests and foci of both industry and academia with respect to clocking. It is very up-to-date and co-authored by a panel of industry experts involved in clock design in major processor chips. Clocking in Modern VLSI Systems is authored from a strong design perspective and will help readers interested in clock design obtain the necessary background information and tools for such a task. The book also captures design trends that have appeared over the last few years and provides a comprehensive list of references for further study
UR  - http://ezproxy.alfaisal.edu/login?url=http://dx.doi.org/10.1007/978-1-4419-0261-0
ER  -