TY  - BOOK
AU  - Mahoney,Christine M.
ED  - Wiley eBooks.
TI  - Cluster secondary ion mass spectrometry: principles and applications 
T2  - Wiley series on mass spectrometry
SN  - 9781118589335
AV  - QD96.S43 .M34 2013 
PY  - 2013///
CY  - Hoboken, New Jersey
PB  - Wiley
KW  - Secondary ion mass spectrometry
KW  - Secondary electron emission
KW  - Surfaces (Physics)
KW  - SCIENCE
KW  - Chemistry
KW  - Analytic
KW  - bisacsh
KW  - fast
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index
N2  - This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors. The text covers a wide range of topics, encompassing fundamentals, theory, and applications including cluster sources, organic and polymeric depth profiling, and 3-D imaging in organic and polymeric materials. Written by founders in the field, this guide creates a peerless compendium of knowledge on this cutting edge set of methods
UR  - http://ezproxy.alfaisal.edu/login?url=http://dx.doi.org/10.1002/9781118589335
UR  - http://ezproxy.alfaisal.edu/login?url=http://onlinelibrary.wiley.com/book/10.1002/9781118589335
ER  -