Advances in imaging and electron physics.  Volume 136 / 
edited by Peter W. Hawkes. 
 - Amsterdam ;  Boston :  Elsevier Academic Press,  ©2005. 
 - 1 online resource (xv, 333 pages) :  illustrations. 
 - Advances in imaging and electron physics,  136  1076-5670 ; .
 - Advances in imaging and electron physics ;  136. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/>Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Real and Complex PDE-Based Schemes for Image Sharpening and Enhancement; The S-State Model for Electron Channeling in High-Resolution Electron Microscopy; Measurement of Electric Fields on Object Surface in an Emission Electron Microscope; Index. 
<br/><br/> Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. 
<br/><br/><label>ISBN: </label>0080458556 9780080458557 0120147785 9780120147786 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Image processing.<br/>Electron microscopy.<br/>SCIENCE--Physics--Electromagnetism.<br/>SCIENCE--Physics--Electricity.<br/>Electron microscopy.<br/>Image processing.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QC793.5.E62  / A38eb vol. 136