Advances in imaging and electron physics  Volume 158 / 
edited by Peter W. Hawkes. 
 - 1st ed. 
 - Amsterdam ;  New York :  Elsevier/Academic Press,  2009. 
 - 1 online resource (xiv, 241 pages) :  illustrations. 
 - Advances in imaging and electron physics ;  v. 158 .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopy.<br/>Electron microscopy.<br/>Electron microscopy.<br/>Microscopy.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QH201  / .A2158 2009eb