Advances in imaging and electron physics  Volume 167 / 
edited by Peter W. Hawkes. 
 - 1st ed. 
 - Amsterdam :  Elsevier,  2011. 
 - 1 online resource (xiv, 345 pages, [8] pages of plates) :  illustrations (some color). 
 - Advances in imaging and electron physics,  v. 167  1076-5670 ; .
<br/><br/>Includes bibliographical references and index. 
<br/><br/> Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians. 
<br/><br/><label>ISBN: </label>9780123859860 0123859867 9780123859853 0123859859 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrons.<br/>Imaging systems.<br/>TECHNOLOGY & ENGINEERING--Imaging Systems.<br/>Electrons.<br/>Imaging systems.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QC793.2  / .A38 2011eb