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121. eBooks
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122. eBooks
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132. eBooks
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Defects in High-k Gate Dielectric Stacks [electronic resource] : Nano-Electronic Semiconductor Devices / edited by Evgeni Gusev. by Series: NATO Science Series II: Mathematics, Physics and Chemistry ; 220Publisher: Dordrecht : Springer Netherlands, 2006
Other title:
  • Proceedings of the NATO Advanced Research Workshop on Defects in Advanced High-K Dielectric Nano-Electronic Semiconductor Devices, St. Petersburg, Russia, from 11 to 14 July 2005.
In: Springer eBooks
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