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21.	Image from Amazon.com	Parts selection and management [electronic resource] / edited by Michael G. Pecht. by Pecht, Michael ebrary, Inc Publication details: Hoboken, N.J. : John Wiley, 2004 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
22.	Image from Amazon.com	New trends in software methodologies, tools and techniques [electronic resource] : proceedings of Lyee-W02 / edited by Hamido Fujita and Paul Johannesson. by Lyee-W02 (2002 : Paris, France) Fujita, Hamido Johannesson, Paul, 1959- ebrary, Inc Series: Frontiers in artificial intelligence and applications ; v. 84. Publication details: Amsterdam ; Washington, DC : IOS Press/Ohmsha, c2002 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
23.	Image from Amazon.com	Response modeling methodology [electronic resource] : empirical modeling for engineering and science / Haim Shore. by Shore, Haim ebrary, Inc Series: Series on quality, reliability & engineering statistics ; v. 8. Publication details: Singapore : Hong Kong : World Scientific, c2005 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
24.	Image from Amazon.com	Inference and generalizability in applied linguistics [electronic resource] : multiple perspectives / edited by Micheline Chalhoub-Deville, Carol A. Chapelle, Patricia Duff. by Chalhoub-Deville, Micheline Chapelle, Carol Duff, Patricia ebrary, Inc Series: Language learning and language teaching ; v. 12. Publication details: Amsterdam ; Philadelphia : J. Benjamins Pub. Co., c2006 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
25.	Image from Amazon.com	Accelerated testing and validation [electronic resource] : testing, engineering, and management tools for lean development / by Alex Porter. by Porter, Alex ebrary, Inc Publication details: Amsterdam ; London : Newnes, 2004 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
26.	Image from Amazon.com	Reliability, maintainability and risk [electronic resource] : practical methods for engineers / David J. Smith. by Smith, David John, 1943- ebrary, Inc Edition: 7th ed. Publication details: Amsterdam ; Boston : Elsevier Butterworth-Heinemann, 2005 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
27.	Image from Amazon.com	Advanced reliability modeling [electronic resource] : part II / guest editors: Tadashi Dohi, Naoto Kaio and Won Young Yun. by Dohi, Tadashi Kaio, Naoto Yun, Won Young ebrary, Inc Series: Journal of Quality in Maintenance Engineering ; 12, no. 4 Publication details: Bradford, England : Emerald Group Publishing, c2006 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
28.	Image from Amazon.com	RCM [electronic resource] : gateway to world class maintenance / Anthony M. Smith and Glenn R. Hinchcliffe. by Smith, Anthony M Hinchcliffe, Glenn R ebrary, Inc Publication details: Amsterdam ; Boston : Elsevier Butterworth-Heinemann, c2004 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
29.	Image from Amazon.com	Reliable reasoning [electronic resource] : induction and statistical learning theory / Gilbert Harman and Sanjeev Kulkarni. by Harman, Gilbert Kulkarni, Sanjeev ebrary, Inc Series: Jean Nicod lectures ; 2007. Publication details: Cambridge, Mass. : MIT Press, c2007 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
30.	Image from Amazon.com	Advanced reliability modeling [electronic resource] : proceedings of the 2004 Asian International Workshop (AIWARM 2004) : Hiroshima, Japan, 26-27 August 2004 / edited by Tadashi Dohi, Won Young Yun. by Asian International Workshop on Advanced Reliability Modeling (2004 : Hiroshima-shi, Japan) Dohi, Tadashi Yun, Won Young ebrary, Inc Publication details: New Jersey ; London : World Scientific, c2004 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
31.	Image from Amazon.com	Modern statistical and mathematical methods in reliability [electronic resource] / editors, Alyson Wilson ... [et al.]. by Wilson, Alyson G, 1967- ebrary, Inc Series: Series on quality, reliability & engineering statistics ; v. 10. Publication details: Singapore ; Hackensack, NJ : World Scientific, c2005 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
32.	Image from Amazon.com	Pipeline risk management manual [electronic resource] : ideas, techniques, and resources / by W. Kent Muhlbauer. by Muhlbauer, W. Kent ebrary, Inc Edition: 3rd ed. Publication details: Amsterdam ; Boston : Elsevier, c2004 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
33.	Image from Amazon.com	Deploying IP and MPLS QoS for multiservice networks [electronic resource] : theory and practice / John Evans, Clarence Filsfils. by Evans, John Filsfils, Clarence ebrary, Inc Publication details: San Francisco : Oxford : Morgan Kaufmann ; Elsevier Science [distributor], 2007 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
34.	Image from Amazon.com	Fault-tolerant systems [electronic resource] / Israel Koren, C. Mani Krishna. by Koren, Israel, 1945- Krishna, C. M ebrary, Inc Publication details: Amsterdam ; Boston : Elsevier/Morgan Kaufmann, c2007 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
35.	Image from Amazon.com	Software system reliability and security [electronic resource] / edited by Manfred Broy, Johannes Gr�unbauer and Tony Hoare. by Broy, M, 1949- Gr�unbauer, Johannes Hoare, C. A. R. (Charles Antony Richard), 1934- ebrary, Inc Series: NATO security through science series. D, Information and communication security ; ; v. 9. Publication details: Amsterdam ; Washington, DC : IOS Press, c2007 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
36.	Image from Amazon.com	An introduction to the basics of reliability and risk analysis [electronic resource] / Enrico Zio. by Zio, Enrico ebrary, Inc Series: Series on quality, reliability & engineering statistics ; v. 13. Publication details: Singapore : World Scientific, c2007 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
37.	Image from Amazon.com	Computer systems performance evaluation and prediction [electronic resource] / Paul J. Fortier, Howard E. Michel. by Fortier, Paul J Michel, Howard Edgar ebrary, Inc Publication details: Burlington, MA : Digital Press, c2003 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
38.	Image from Amazon.com	Software for dependable systems [electronic resource] : sufficient evidence? / Daniel Jackson, Martyn Thomas, and Lynette I. Millett, eds. ; Committee on Certifiably Dependable Software Systems, Computer Science and Telecommunications Board, Division on Engineering and Physical Sciences, National Research Council of the National Academies. by National Research Council (U.S.). Committee on Certifiably Dependable Software Systems Jackson, Daniel Millett, Lynette I Thomas, Martyn ebrary, Inc Publication details: Washington, D.C. : National Academies Press, c2007 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
39.	Image from Amazon.com	Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin. by Dumin, D. J ebrary, Inc Series: Selected topics in electronics and systems ; v. 23. Publication details: [River Edge, NJ] : World Scientific, c2002 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
40.	Image from Amazon.com	Computer system performance modeling in perspective [electronic resource] : a tribute to the work of Professor Kenneth C. Sevcik / editor Erol Gelenbe. by Gelenbe, E, 1945- ebrary, Inc Series: Advances in computer science and engineering. Texts ; ; v. 1. Publication details: London : Imperial College Press, c2006 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)