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321.	Image from Amazon.com	Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor. by Tehranipoor, Mohammad [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 37Publisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
322.	Image from Amazon.com	Engineering Optics [electronic resource] / by Keigo Iizuka. by Iizuka, Keigo [author.] SpringerLink (Online service) Series: Springer Series in Optical Sciences ; 35Publisher: New York, NY : Springer New York, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
323.	Image from Amazon.com	Nanometer Technology Designs High-Quality Delay Tests [electronic resource] / by Mohammad Tehranipoor, Nisar Ahmed. by Tehranipoor, Mohammad [author.] Ahmed, Nisar [author.] SpringerLink (Online service) Publisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
324.	Image from Amazon.com	Adaptive Techniques for Dynamic Processor Optimization [electronic resource] : Theory and Practice / edited by Alice Wang, Samuel Naffziger. by Wang, Alice [editor.] Naffziger, Samuel [editor.] SpringerLink (Online service) Series: Series on Integrated Circuits and SystemsPublisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
325.	Image from Amazon.com	Low-Power High-Level Synthesis for Nanoscale CMOS Circuits [electronic resource] / by Priyardarsan Patra, Elias Kougianos, Nagarajan Ranganathan, Saraju P. Mohanty. by Patra, Priyardarsan [author.] Kougianos, Elias [author.] Ranganathan, Nagarajan [author.] Mohanty, Saraju P [author.] SpringerLink (Online service) Publisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
326.	Image from Amazon.com	RFID Security [electronic resource] : Techniques, Protocols and System-on-Chip Design / edited by Paris Kitsos, Yan Zhang. by Kitsos, Paris [editor.] Zhang, Yan [editor.] SpringerLink (Online service) Publisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
327.	Image from Amazon.com	Nanoelectronics and Photonics [electronic resource] : From Atoms to Materials, Devices, and Architectures / edited by Anatoli Korkin, Federico Rosei. by Korkin, Anatoli [editor.] Rosei, Federico [editor.] SpringerLink (Online service) Series: Nanostructure Science and TechnologyPublisher: New York, NY : Springer New York, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
328.	Image from Amazon.com	System Verilog for Verification [electronic resource] : A Guide to Learning the Testbench Language Features / by Chris Spear. by Spear, Chris [author.] SpringerLink (Online service) Edition: Second Edition. Publisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
329.	Image from Amazon.com	Wafer Level 3-D ICs Process Technology [electronic resource] / edited by Chuan Seng Tan, Ronald J. Gutmann, L. Rafael Reif. by Tan, Chuan Seng [editor.] Gutmann, Ronald J [editor.] Reif, L. Rafael [editor.] SpringerLink (Online service) Series: Integrated Circuits and SystemsPublisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
330.	Image from Amazon.com	Synchronized Phasor Measurements and Their Applications [electronic resource] / by A.G. Phadke, J.S. Thorp. by Phadke, A.G [author.] Thorp, J.S [author.] SpringerLink (Online service) Series: Power Electronics and Power SystemsPublisher: Boston, MA : Springer US : Imprint: Springer, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
331.	Image from Amazon.com	Piezoelectric and Acoustic Materials for Transducer Applications [electronic resource] / edited by Ahmad Safari, E. Koray Akdoğan. by Safari, Ahmad [editor.] Akdoğan, E. Koray [editor.] SpringerLink (Online service) Publisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
332.	Image from Amazon.com	The Uncertainty in Physical Measurements [electronic resource] : An Introduction to Data Analysis in the Physics Laboratory / by Paolo Fornasini. by Fornasini, Paolo [author.] SpringerLink (Online service) Publisher: New York, NY : Springer New York : Imprint: Springer, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
333.	Image from Amazon.com	Adaptive Structural Systems with Piezoelectric Transducer Circuitry [electronic resource] / by Jiong Tang, Kon-Well Wang. by Tang, Jiong [author.] Wang, Kon-Well [author.] SpringerLink (Online service) Publisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
334.	Image from Amazon.com	Advanced Environmental Monitoring [electronic resource] / edited by Young J. Kim, Ulrich Platt. by Kim, Young J [editor.] Platt, Ulrich [editor.] SpringerLink (Online service) Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
335.	Image from Amazon.com	Mid-Infrared Coherent Sources and Applications [electronic resource] / edited by Majid Ebrahim-Zadeh, Irina T. Sorokina. by Ebrahim-Zadeh, Majid [editor.] Sorokina, Irina T [editor.] SpringerLink (Online service) Series: NATO Science for Peace and Security Series B: Physics and BiophysicsPublisher: Dordrecht : Springer Netherlands, 2008 Other title: Results of the NATO Advanced Research Workshop on Middle Infrared Coherent Sources (MICS) 2005, Barcelona, Spain, 6-11 November 2005. In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
336.	Image from Amazon.com	Design, Automation, and Test in Europe [electronic resource] : The Most Influential Papers of 10 Years Date / edited by Rudy Lauwereins, Jan Madsen. by Lauwereins, Rudy [editor.] Madsen, Jan [editor.] SpringerLink (Online service) Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
337.	Image from Amazon.com	High Time Resolution Astrophysics [electronic resource] / edited by Don Phelan, Oliver Ryan, Andrew Shearer. by Phelan, Don [editor.] Ryan, Oliver [editor.] Shearer, Andrew [editor.] SpringerLink (Online service) Series: Astrophysics and Space Science Library ; 351Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
338.	Image from Amazon.com	Adaptive Multi-Standard RF Front-Ends [electronic resource] / by Vojkan Vidojkovic, Johan van der Tang, Arjan Leeuwenburgh, Arthur van Roermund. by Vidojkovic, Vojkan [author.] Tang, Johan van der [author.] Leeuwenburgh, Arjan [author.] Roermund, Arthur van [author.] SpringerLink (Online service) Series: Analog Circuits and Signal Processing SeriesPublisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
339.	Image from Amazon.com	Robustness and Usability in Modern Design Flows [electronic resource] / by Görschwin Fey, Rolf Drechsler. by Fey, Görschwin [author.] Drechsler, Rolf [author.] SpringerLink (Online service) Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
340.	Image from Amazon.com	Silicon-Based RF Front-Ends for Ultra Wideband Radios [electronic resource] / edited by Aminghasem Safarian, Payam Heydari. by Safarian, Aminghasem [editor.] Heydari, Payam [editor.] SpringerLink (Online service) Series: Analog Circuits and Signal ProcessingPublisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)