Results of search for 'ccl=su:{Reliability}'

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41.	Image from Amazon.com	Advanced reliability modeling II [electronic resource] : reliability testing and improvement : proceedings of the 2nd Asian International Workshop (AIWARM 2006), Busan, Korea, 24-26 August 2006 / edited by Won Young Yun, Tadashi Dohi. by Asian International Workshop on Advanced Reliability Modeling (2nd : 2006 : Pusan, Korea) Dohi, Tadashi Yun, Won Young ebrary, Inc Publication details: Singapore ; Hong Kong : World Scientific, c2006 Other title: AIWARM 2006 Proceedings of the 2nd Asian International Workshop Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
42.	Image from Amazon.com	Information assurance [electronic resource] : dependability and security in networked systems / [edited by] Yi Qian ... [et al.]. by Qian, Yi, 1962- ebrary, Inc Series: Morgan Kaufmann series in computer security \| Morgan Kaufmann series in networking Publication details: Amsterdam ; Boston : Elsevier/Morgan Kaufmann, c2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
43.	Image from Amazon.com	Resilience engineering [electronic resource] : concepts and precepts / edited by Erik Hollnagel, David D. Woods, Nancy Leveson. by Hollnagel, Erik, 1941- Leveson, Nancy Woods, David D, 1952- ebrary, Inc Publication details: Aldershot, England ; Burlington, VT : Ashgate, c2006 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
44.	Image from Amazon.com	Voting technology [electronic resource] : the not-so-simple act of casting a ballot / Paul S. Herrnson ... [et al.]. by Herrnson, Paul S, 1958- ebrary, Inc Publication details: Washington, D.C. : Brookings Institution Press, c2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
45.	Image from Amazon.com	Bayesian reliability [electronic resource] / Michael S. Hamada ... [et al.]. by Hamada, Michael, 1955- ebrary, Inc Series: Springer series in statistics Publication details: New York, NY : Springer, c2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
46.	Image from Amazon.com	Handbook of performability engineering [electronic resource] / Krishna B. Misra, editor. by Misra, Krishna B, 1943- ebrary, Inc Publication details: London : Springer, 2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
47.	Image from Amazon.com	Recent advances in reliability and quality engineering [electronic resource] / editor, Hoang Pham. by Pham, Hoang ebrary, Inc Series: Series on quality, reliability & engineering statistics ; vol. 2. Publication details: Singapore ; New Jersey : World Sceintific, c2001 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
48.	Image from Amazon.com	Human reliability and error in medical system [electronic resource] / B.S. Dhillon. by Dhillon, B. S. (Balbir S.), 1947- ebrary, Inc Series: Series on industrial and systems engineering ; v. 2. Publication details: New Jersey : World Scientific Pub., c2003 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
49.	Image from Amazon.com	System and Bayesian reliability [electronic resource] : essays in honor of Professor Richard E. Barlow on his 70th birthday / editors, Yu Hayakawa, Telba Irony, Min Xie. by Barlow, Richard E Hayakawa, Yu Irony, Telba Xie, M. (Min) ebrary, Inc Series: Series on quality, reliability & engineering statistics ; v. 5. Publication details: River Edge, NJ : World Scientific, c2001 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
50.	Image from Amazon.com	Advances in mathematical modeling for reliability [electronic resource] / edited by Tim Bedford ... [et al.]. by Bedford, T ebrary, Inc Mathematical Methods in Reliability (5th : 2007 : Glasgow, Scotland) Publication details: Amsterdam ; Washington, DC : IOS Press, c2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
51.	Image from Amazon.com	Semi-Markov chains and hidden semi-Markov models toward applications [electronic resource] : their use in reliability and DNA analysis / Vlad Stefan Barbu and Nikolaos Limnios. by Barbu, Vlad Stefan Limnios, N. (Nikolaos) ebrary, Inc Series: Lecture notes in statistics (Springer-Verlag) ; v. 191. Publication details: New York : Springer, 2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
52.	Image from Amazon.com	Viewpoints and controversies in sensory science and consumer product testing [electronic resource] / by Howard R. Moskowitz, Alejandra M. Mu�noz, Maximo C. Gacula. by Moskowitz, Howard R Mu�noz, Alejandra M, 1957- Gacula, Maximo C ebrary, Inc Series: Publications in food science and nutrition Publication details: Trumbull, Conn. : Food & Nutrition Press, c2003 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
53.	Image from Amazon.com	Using aspect-oriented programming for trustworthy software development [electronic resource] / Vladimir O. Safonov. by Safonov, V. O. (Vladimir Olegovich) ebrary, Inc Publication details: Hoboken, N.J. : Wiley-Interscience, c2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
54.	Image from Amazon.com	ESD [electronic resource] : failure mechanisms and models / Steven H. Voldman. by Voldman, Steven H ebrary, Inc Publication details: Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009 Other title: Electrostatic discharge Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
55.	Image from Amazon.com	Reliability and quality management [electronic resource] / R.C. Mishra, Ankit Sandilya. by Mishra, R. C Sandilya, Ankit ebrary, Inc Publication details: New Delhi : New Age International (P) Ltd., Publishers, c2009 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
56.	Image from Amazon.com	Lead-free solder interconnect reliability [electronic resource] / edited by Dongkai Shangguan. by Shangguan, Dongkai, 1963- ebrary, Inc Publication details: Materials Park, OH : ASM International, 2005 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
57.	Image from Amazon.com	Transient-induced latchup in CMOS integrated circuits [electronic resource] / Ming-Dou Ker and Sheng-Fu Hsu. by Ker, Ming-Dou Hsu, Sheng-Fu ebrary, Inc Publication details: Singapore ; Hoboken, NJ : Wiley, c2009 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
58.	Image from Amazon.com	Robust design methodology for reliability [electronic resource] : exploring the effects of variation and uncertainty / edited by Bo Bergman ... [et al.]. by Bergman, Bo, 1943- ebrary, Inc Publication details: Chichester, West Sussex, U.K. ; Hoboken, N.J. : Wiley, 2009 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
59.	Image from Amazon.com	Software error detection through testing and analysis [electronic resource] / J.C. Huang. by Huang, J. C, 1935- ebrary, Inc Publication details: Hoboken, N.J. : John Wiley & Sons, c2009 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
60.	Image from Amazon.com	Electronic elections [electronic resource] : the perils and promises of digital democracy / R. Michael Alvarez and Thad E. Hall. by Alvarez, R. Michael, 1964- Hall, Thad E. (Thad Edward), 1968- ebrary, Inc Publication details: Princeton, N.J. : Princeton University Press, c2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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