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Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th Birthday / editors, Syouji Nakamura, Kinjo Gakuin University, Japan, Cun Hua Qian, Nanjing University of Technology, China, Mingchih Chen, Fe Jen Catholic University, Taiwan. by Publisher: New Jersey : World Scientific, [2014]Copyright date: �2014
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