Your search returned 870 results.

Results
861.	Image from Amazon.com	Multivariate statistical methods in quality management [electronic resource] / Kai Yang, Jayant Trewn. by Yang, Kai Trewn, Jayant McGraw-Hill eBooks Series: McGraw-Hill's AccessEngineering Publication details: New York : McGraw-Hill, [2004] Online resources: Subscription required Availability: No items available. Place hold Save to lists Add to cart (remove)
862.	Image from Amazon.com	Mechanical design handbook [electronic resource] : measurement, analysis, and control of dynamic systems / Harold A. Rothbart, editor, Thomas H. Brown, Jr., editor. by Rothbart, Harold A Brown, Thomas H Mitchell, Thomas P Bennett, Stephen B Kolb, Robert P Freudenstein, Ferdinand Sandor, George N Ungar, Eric E Tipton, Steven M Gela, Theodore Tabor, David Kaminsky, Sheldon Sage, Andrew P Powell, J. David Smith, Warren J Paul, Burton Kapur, Kailash C Lamberson, Leonard R Hamrock, Bernard J Anderson, William J Johnson, John E Dow, Thomas A Baier, William H Tordion, George V Coy, John J Townsend, Dennis P Zaretsky, Erwin V Relvas, Abilio A McGraw-Hill eBooks Series: McGraw-Hill's AccessEngineering Edition: 2nd ed. Publication details: New York : McGraw-Hill, [2006] Online resources: Subscription required Availability: No items available. Place hold Save to lists Add to cart (remove)
863.	Image from Amazon.com	Microvias : for low-cost, high-density interconnects [electronic resource] / John H. Lau, S.W. Ricky Lee. by Lau, John H Lee, S. W. Ricky McGraw-Hill eBooks Series: McGraw-Hill's AccessEngineering Publication details: New York : McGraw-Hill, [2001] Online resources: Subscription required Availability: No items available. Place hold Save to lists Add to cart (remove)
864.	Image from Amazon.com	Stormwater collection systems design handbook [electronic resource] / Larry W. Mays, editor in chief. by Mays, Larry W Dodson, Roy D Maske, Craig T French, Richard H Westphal, Jerome A Nicklow, John W Chie Yen, Ben Paine, John N Akan, A. Osman Guo, James C. Y Wass, Roland D Wright, Leonard T Heaney, James P Lansey, Kevin El-Shorbagy, Walid Roberts, Brian C Delleur. Jacques W Tuncok, I. Kaan Cotton, George K Carriaga, Carlos Armitage, Neil Zhao, Bing Tung, Yeou-Koung Yen, Ben C Stein, Stuart Young, Ken McGraw-Hill eBooks Series: McGraw-Hill's AccessEngineering Publication details: New York : McGraw-Hill, [2001] Online resources: Subscription required Availability: No items available. Place hold Save to lists Add to cart (remove)
865.	Image from Amazon.com	Fundamentals of microsystems packaging [electronic resource] / Rao R. Tummala, editor. by Tummala, Rao R, 1942- Morris, James E Davidson, Evan Sarma, D. H. R Hubbard, Bob Rao, N. J Swaminathan, Madhavan Peterson, Andrew F Kim, Juongho Sitaraman, Suresh K Pang, John H. L Bar-Cohen, Avram Watwe, Abhay Seetharamu, Kankanhally N Kamath, Sundar M Charles, Harry K Baldwin, David F Garrou, Phil Prymak, John Bhattacharya, Swapan Paik, Kyung Cruz Rivera, Jose L Gaylord, Thomas K Glytsis, Elias N Laskar, Joy Tentzeris, Emmanouil M Schutt-Aine, Jose E Ramesham, Rajeshuni Ghaffarian, Reza Ayazi, Farrokh Wong, C. P Fang, Treliant Varadarajan, Mahesh Illyefalvi-Vitez, Zsolt ZImmermann, Joachim Mattsson, Fredrik Kandelid, Stefan Raj, Pulugurtha Markondeya Liu, Johan Ohlckers, Per Keezer, David Kim, Bruce Koppolu, Sasidhar May, Gary S Shinotani, Ken-ichi Malmodin, Jens Trankell, Richard Qu, Jianmin Guo, Yifan McGraw-Hill eBooks Series: McGraw-Hill's AccessEngineering Publication details: New York : McGraw-Hill, [2001] Online resources: Subscription required Availability: No items available. Place hold Save to lists Add to cart (remove)
866.	Image from Amazon.com	Reliability of RoHS-Compliant 2D and 3D IC interconnects [electronic resource] / John H. Lau. by Lau, John H McGraw-Hill eBooks Series: McGraw-Hill's AccessEngineering \| McGraw-Hill electronic engineering series Publication details: New York : McGraw-Hill, [2011] Online resources: Subscription required Availability: No items available. Place hold Save to lists Add to cart (remove)
867.	Image from Amazon.com	Navy network dependability : models, metrics, and tools / Isaac R. Porche III ... [et al.]. by Porche, Isaac, 1968- [author.] Comanor, Katherine [author.] Wilson, Bradley [author.] Schneider, Matthew J [author.] Rothenberg, Jeff, 1947- [author.] National Defense Research Institute (U.S.). Acquisition and Technology Policy Center Rand Corporation United States. Navy Publisher: Santa Monica, CA : RAND, 2010 Online resources: Online Access Availability: No items available. Place hold Save to lists Add to cart (remove)
868.	Image from Amazon.com	A new view of weapon system reliability and maintainability / J. R. Gebman, D. W. McIver, H. L. Shulman. by Gebman, J. R [author.] McIver, D. W [author.] Shulman, Hyman L, 1919- [author.] Project Air Force (U.S.). Resource Management Program Rand Corporation United States. Air Force Publisher: Santa Monica, CA : RAND, 1989 Online resources: Online Access Availability: No items available. Place hold Save to lists Add to cart (remove)
869.	Image from Amazon.com	A new view of weapon system reliability and maintainability : executive summary / J. R. Gebman, D. W. McIver, H. L. Shulman. by Gebman, J. R [author.] McIver, D. W [author.] Shulman, Hyman L, 1919- [author.] Project Air Force (U.S.). Resource Management Program Rand Corporation United States. Air Force Publisher: Santa Monica, CA : RAND, 1989 Online resources: Online Access Availability: No items available. Place hold Save to lists Add to cart (remove)
870.	Image from Amazon.com	Strengthening the grid : effect of high-temperature superconducting power technologies on reliability, power transfer capacity, and energy use / Richard Silberglitt, Emile Ettedgui, Anders Hove. by Silberglitt, R. S. (Richard S.) [author.] Ettedgui, Emile [author.] Hove, Anders [author.] Science and Technology Policy Institute (Rand Corporation) Rand Corporation United States. Department of Energy Publisher: Santa Monica, CA : RAND, 2002 Online resources: Online Access Availability: No items available. Place hold Save to lists Add to cart (remove)