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1.	Image from Amazon.com	Evolution of Thin Film Morphology [electronic resource] : Modeling and Simulations / by Matthew Pelliccione, Toh-Ming Lu. by Pelliccione, Matthew [author.] Lu, Toh-Ming [author.] SpringerLink (Online service) Series: Materials Science ; 108Publisher: New York, NY : Springer New York, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
2.	Image from Amazon.com	RHEED Transmission Mode and Pole Figures [electronic resource] : Thin Film and Nanostructure Texture Analysis / by Gwo-Ching Wang, Toh-Ming Lu. by Wang, Gwo-Ching [author.] Lu, Toh-Ming [author.] SpringerLink (Online service) Publisher: New York, NY : Springer New York : Imprint: Springer, 2014 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
3.	Image from Amazon.com	Metal-Dielectric Interfaces in Gigascale Electronics [electronic resource] : Thermal and Electrical Stability / by Ming He, Toh-Ming Lu. by He, Ming [author.] Lu, Toh-Ming [author.] SpringerLink (Online service) Series: Springer Series in Materials Science ; 157Publisher: New York, NY : Springer New York, 2012 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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