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1.	Image from Amazon.com	Electromigration in ULSI interconnections [electronic resource] / Cher Ming Tan. by Tan, Cher Ming, 1959- ebrary, Inc Series: International series on advances in solid state electronics and technology Publication details: Hackensack, N.J. : World Scientific, c2010 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
2.	Image from Amazon.com	Electromigration Modeling at Circuit Layout Level [electronic resource] / by Cher Ming Tan, Feifei He. by Tan, Cher Ming [author.] He, Feifei [author.] SpringerLink (Online service) Series: SpringerBriefs in Applied Sciences and TechnologyPublisher: Singapore : Springer Singapore : Imprint: Springer, 2013 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
3.	Image from Amazon.com	Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections [electronic resource] / by Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou. by Tan, Cher Ming [author.] Li, Wei [author.] Gan, Zhenghao [author.] Hou, Yuejin [author.] SpringerLink (Online service) Series: Springer Series in Reliability Engineering Edition: 1. Publisher: London : Springer London, 2011 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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