Your search returned 11 results.

Results
	1.		Image from Amazon.com	Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. by Nicolici, Nicola Al-Hashimi, Bashir ebrary, Inc Series: Frontiers in electronic testing ; 22. Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	2.		Image from Amazon.com	VLSI test principles and architectures [electronic resource] : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. by Wang, Laung-Terng Wen, Xiaoqing Wu, Cheng-Wen, EE Ph. D ebrary, Inc Series: Morgan Kaufmann series in systems on silicon Publication details: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	3.		Image from Amazon.com	System-on-chip test architectures [electronic resource] : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. by Stroud, Charles E Touba, Nur A Wang, Laung-Terng ebrary, Inc Series: Morgan Kaufmann series in systems on silicon Publication details: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	4.		Image from Amazon.com	Principles and applications of distributed event-based systems [electronic resource] / Annika M. Hinze, Alejandro Buchmann [editors]. by Buchmann, Alejandro P Hinze, Annika IGI eBooks IGI Global Publication details: Hershey, Pa. : IGI Global (701 E. Chocolate Avenue, Hershey, Pennsylvania, 17033, USA), c2010 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	5.		Image from Amazon.com	VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. by Wang, Laung-Terng [editor.] Wu, Cheng-Wen, EE Ph. D [editor.] Wen, Xiaoqing [editor.] ScienceDirect eBooks Series: Morgan Kaufmann series in systems on silicon©2006 Online resources: Click here to access online Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	6.		Image from Amazon.com	System-on-chip test architectures : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. by Wang, Laung-Terng Stroud, Charles E Touba, Nur A ScienceDirect eBooks Series: Morgan Kaufmann series in systems on silicon©2008 Online resources: Click here to access online Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	7.		Image from Amazon.com	New approaches to image processing based failure analysis of nano-scale ULSI devices / Zeev Zalevsky, Pavel Livshits, Eran Gur. by Zalevsky, Zeev Livshits, Pavel Gur, Eran ScienceDirect eBooks Series: Micro & nano technologies2014 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	8.		Image from Amazon.com	VLSI test principles and architectures [electronic resource] : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. by Wang, Laung-Terng Wu, Cheng-Wen, EE Ph. D Wen, Xiaoqing Safari eBooks Series: Morgan Kaufmann series in systems on silicon \| Safari Books Onlinec2006 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	9.		Image from Amazon.com	System-on-chip test architectures [electronic resource] : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. by Wang, Laung-Terng Stroud, Charles E Touba, Nur A Safari eBooks Series: Morgan Kaufmann series in systems on silicon \| Safari Books Onlinec2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	10.			Built-in test for VLSI [electronic resource] : pseudorandom techniques / Paul H. Bardell, William H. McAnney, Jacob Savir. by Bardell, Paul H McAnney, William H Savir, Jacob Safari eBooks c1987 Other title: Built-in test for very large scale integration Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	11.		Image from Amazon.com	An introduction to logic circuit testing [electronic resource] / Parag K. Lala. by Lala, Parag K, 1948- Safari eBooks Series: Synthesis lectures on digital circuits and systems ; #17.c2009 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

Copyright © 2020 Alfaisal University Library. All Rights Reserved.
Tel: +966 11 2158948 Fax: +966 11 2157910 Email: librarian@alfaisal.edu