System and Bayesian reliability [electronic resource] : essays in honor of Professor Richard E. Barlow on his 70th birthday / editors, Yu Hayakawa, Telba Irony, Min Xie.
Series: Series on quality, reliability & engineering statistics ; v. 5.Publication details: River Edge, NJ : World Scientific, c2001.Description: xxvii, 409 p. : illISBN:- 9789810248659
- 9810248652
- TA169 .S977 2001eb

Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.