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	1.		Image from Amazon.com	Machine Vision [electronic resource] : Automated Visual Inspection: Theory, Practice and Applications / by Jürgen Beyerer, Fernando Puente León, Christian Frese. by Beyerer, Jürgen [author.] Puente León, Fernando [author.] Frese, Christian [author.] SpringerLink (Online service) Edition: 1st ed. 2016. Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2016 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	2.		Image from Amazon.com	Machine Learning for Cyber Physical Systems [electronic resource] : Selected papers from the International Conference ML4CPS 2015 / edited by Oliver Niggemann, Jürgen Beyerer. by Niggemann, Oliver [editor.] Beyerer, Jürgen [editor.] SpringerLink (Online service) Series: Technologien für die intelligente Automation, Technologies for Intelligent Automation Edition: 1st ed. 2016. Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer Vieweg, 2016 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	3.		Image from Amazon.com	KI 2010: Advances in Artificial Intelligence [electronic resource] : 33rd Annual German Conference on AI, Karlsruhe, Germany, September 21-24, 2010. Proceedings / edited by Rüdiger Dillmann, Jürgen Beyerer, Uwe D. Hanebeck, Tanja Schultz. by Dillmann, Rüdiger [editor.] Beyerer, Jürgen [editor.] Hanebeck, Uwe D [editor.] Schultz, Tanja [editor.] SpringerLink (Online service) Series: Lecture Notes in Computer Science ; 6359Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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