Statistical Analysis and Optimization for VLSI: Timing and Power [electronic resource] / by Ashish Srivastava, Dennis Sylvester, David Blaauw.

By:

Srivastava, Ashish [author.]

Contributor(s):

Series: Series on Integrated Circuits and SystemsPublisher: Boston, MA : Springer US, 2005Description: X, 280 p. 105 illus. online resourceContent type:

text

Media type:

computer

Carrier type:

online resource

ISBN:

9780387265285

Subject(s):

Genre/Form:

Electronic books.

Additional physical formats: Printed edition:: No titleDDC classification:

621.3815 23

LOC classification:

TK7888.4

Online resources:

Click here to access online

Contents:

Statistical Models and Techniques -- Statistical Timing Analysis -- Statistical Power Analysis -- Yield Analysis -- Statistical Optimization Techniques.

In: Springer eBooksSummary: Statistical Analysis and Optimization for VLSI: Timing and Power is the first book summarizing the state-of-the-art in the newly emerging field of statistical computer-aided design (CAD) tools. The very latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement. Statistical Analysis and Optimization for VLSI: Timing and Power will allow new researchers in this area to come up to speed quickly, as well as provide a handy reference for those already working in CAD tool development.

Item type:

eBooks

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Statistical Models and Techniques -- Statistical Timing Analysis -- Statistical Power Analysis -- Yield Analysis -- Statistical Optimization Techniques.

Statistical Analysis and Optimization for VLSI: Timing and Power is the first book summarizing the state-of-the-art in the newly emerging field of statistical computer-aided design (CAD) tools. The very latest research in statistical timing and power analysis techniques is included, along with efforts to incorporate parametric yield as the key objective function during the design process. The emphasis is on algorithms, modeling approaches for process variability, and statistical techniques that are the cornerstone of the probabilistic CAD movement. Statistical Analysis and Optimization for VLSI: Timing and Power will allow new researchers in this area to come up to speed quickly, as well as provide a handy reference for those already working in CAD tool development.