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Surfaces and interfaces of electronic materials / by Leonard J. Brillson.

By: Contributor(s): Publication details: Weinheim : Wiley-VCH : IEEE, ©2010.Description: 1 online resource (xvii, 570 pages) : illustrations (some color)Content type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783527665709
  • 3527665706
  • 9783527665730
  • 3527665730
Subject(s): Genre/Form: Additional physical formats: Print version:: Surfaces and interfaces of electronic materials.LOC classification:
  • TK7871 .B75 2010
Online resources:
Contents:
Historical Background -- Electrical Measurements -- Interface States -- Ultrahigh Vacuum Technology -- Surface and Interface Analysis -- Photoemission Spectroscopy -- Photoemission with Soft X-Rays -- Particle-Solid Scattering -- Electron Energy Loss Spectroscopy -- Rutherford Backscattering Spectrometry -- Secondary Ion Mass Spectrometry -- Electron Diffraction -- Scanning Tunneling Microscopy -- Optical Spectroscopies -- Cathodoluminescence Spectroscopy -- Electronic Materials' Surfaces -- Adsorbates on Electronic Materials' Surfaces -- Adsorbate-Semiconductor Sensors -- Semiconductor Heterojunctions -- Metals on Semiconductors -- The Future of Interfaces -- Appendix 1: Glossary of Commonly Used Symbols -- Appendix 2: Table of Acronyms -- Appendix 3: Table of Physical Constants and Conversion Factors -- Appendix 4: Semiconductor Properties -- Appendix 5: Table of Preferred Work Functions -- Appendix 6: Derivation of Fermi's Golden Rule -- Appendix 7: Derivation of Photoemission Cross Section for a Square Well.
Summary: An advanced level textbook covering geometric, chemical, and electronic structure of electronic materials, and their applications to devices based on semiconductor surfaces, metal-semiconductor interfaces, and semiconductor heterojunctions. Starting with the fundamentals of electrical measurements on semiconductor interfaces, it then describes the importance of controlling macroscopic electrical properties by atomic-scale techniques.
Item type: eBooks
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Includes bibliographical references and index.

An advanced level textbook covering geometric, chemical, and electronic structure of electronic materials, and their applications to devices based on semiconductor surfaces, metal-semiconductor interfaces, and semiconductor heterojunctions. Starting with the fundamentals of electrical measurements on semiconductor interfaces, it then describes the importance of controlling macroscopic electrical properties by atomic-scale techniques.

Historical Background -- Electrical Measurements -- Interface States -- Ultrahigh Vacuum Technology -- Surface and Interface Analysis -- Photoemission Spectroscopy -- Photoemission with Soft X-Rays -- Particle-Solid Scattering -- Electron Energy Loss Spectroscopy -- Rutherford Backscattering Spectrometry -- Secondary Ion Mass Spectrometry -- Electron Diffraction -- Scanning Tunneling Microscopy -- Optical Spectroscopies -- Cathodoluminescence Spectroscopy -- Electronic Materials' Surfaces -- Adsorbates on Electronic Materials' Surfaces -- Adsorbate-Semiconductor Sensors -- Semiconductor Heterojunctions -- Metals on Semiconductors -- The Future of Interfaces -- Appendix 1: Glossary of Commonly Used Symbols -- Appendix 2: Table of Acronyms -- Appendix 3: Table of Physical Constants and Conversion Factors -- Appendix 4: Semiconductor Properties -- Appendix 5: Table of Preferred Work Functions -- Appendix 6: Derivation of Fermi's Golden Rule -- Appendix 7: Derivation of Photoemission Cross Section for a Square Well.

John Wiley and Sons Wiley eBooks

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