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Neutron and X-Ray microscopy Part 2 / edited by Ted Cremer.

Contributor(s): Series: Advances in imaging and electron physics ; v. 1732012Description: 1 online resource (360 pages)Content type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9780123969699
  • 0123969697
Subject(s): Genre/Form: Additional physical formats: Print version:: No titleLOC classification:
  • TK7800 .A37 2012eb
Online resources: Summary: This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.
Item type: eBooks
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This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.

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