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Safe and Secure Software Reuse [electronic resource] : 13th International Conference on Software Reuse, ICSR 2013, Pisa, June 18-20. Proceedings / edited by John Favaro, Maurizio Morisio.

Contributor(s): Series: Lecture Notes in Computer Science ; 7925Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013Description: XIV, 362 p. 114 illus. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783642389771
Subject(s): Genre/Form: Additional physical formats: Printed edition:: No titleDDC classification:
  • 005.1 23
LOC classification:
  • QA76.758
Online resources:
Contents:
Feature modeling and variability analysis -- Reuse and testing -- Architecture and reuse -- Analysis for reuse -- Reuse and patterns -- Short papers -- Emerging ideas and trends.
In: Springer eBooksSummary: This book constitutes the refereed proceedings of the 13th International Conference on Safe and Secure Software Reuse, ICSR 2013, held in Pisa, Italy, in June 2013. The 27 papers (18 full and 9 short papers) presented were carefully reviewed and selected from various submissions. The papers are organized in topical sections on feature modeling and variability analysis; reuse and testing; architecture and reuse; analysis for reuse; reuse and patterns, short papers, emerging ideas and trends.
Item type: eBooks
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Feature modeling and variability analysis -- Reuse and testing -- Architecture and reuse -- Analysis for reuse -- Reuse and patterns -- Short papers -- Emerging ideas and trends.

This book constitutes the refereed proceedings of the 13th International Conference on Safe and Secure Software Reuse, ICSR 2013, held in Pisa, Italy, in June 2013. The 27 papers (18 full and 9 short papers) presented were carefully reviewed and selected from various submissions. The papers are organized in topical sections on feature modeling and variability analysis; reuse and testing; architecture and reuse; analysis for reuse; reuse and patterns, short papers, emerging ideas and trends.

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