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	1.		Image from Amazon.com	Applied Scanning Probe Methods III [electronic resource] : Characterization / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat [editor.] Fuchs, Harald [editor.] SpringerLink (Online service) Series: NanoScience and TechnologyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	2.		Image from Amazon.com	Applied Scanning Probe Methods IV [electronic resource] : Industrial Applications / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat [editor.] Fuchs, Harald [editor.] SpringerLink (Online service) Series: NanoScience and TechnologyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	3.		Image from Amazon.com	Applied Scanning Probe Methods II [electronic resource] : Scanning Probe Microscopy Techniques / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat [editor.] Fuchs, Harald [editor.] SpringerLink (Online service) Series: NanoScience and TechnologyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	4.		Image from Amazon.com	Applied Scanning Probe Methods V [electronic resource] : Scanning Probe Microscopy Techniques / edited by Bharat Bhushan, Satoshi Kawata, Harald Fuchs. by Bhushan, Bharat [editor.] Kawata, Satoshi [editor.] Fuchs, Harald [editor.] SpringerLink (Online service) Series: NanoScience and TechnologyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	5.		Image from Amazon.com	Applied Scanning Probe Methods VII [electronic resource] : Biomimetics and Industrial Applications / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat [editor.] Fuchs, Harald [editor.] SpringerLink (Online service) Series: NanoScience and TechnologyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	6.		Image from Amazon.com	Applied Scanning Probe Methods VIII [electronic resource] : Scanning Probe Microscopy Techniques / edited by Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. by Bhushan, Bharat [editor.] Fuchs, Harald [editor.] Tomitori, Masahiko [editor.] SpringerLink (Online service) Series: Nano Science and TechnolgyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	7.		Image from Amazon.com	Applied Scanning Probe Methods IX [electronic resource] : Characterization / edited by Masahiko Tomitori, Bharat Bhushan, Harald Fuchs. by Tomitori, Masahiko [editor.] Bhushan, Bharat [editor.] Fuchs, Harald [editor.] SpringerLink (Online service) Series: Nano Science and TechnolgyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	8.		Image from Amazon.com	Applied Scanning Probe Methods X [electronic resource] : Biomimetics and Industrial Applications / edited by Bharat Bhushan, Masahiko Tomitori, Harald Fuchs. by Bhushan, Bharat [editor.] Tomitori, Masahiko [editor.] Fuchs, Harald [editor.] SpringerLink (Online service) Series: Nano Science and TechnolgyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	9.		Image from Amazon.com	Applied Scanning Probe Methods XI [electronic resource] : Scanning Probe Microscopy Techniques / by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat [author.] Fuchs, Harald [author.] SpringerLink (Online service) Series: NanoScience and TechnologyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	10.		Image from Amazon.com	Applied Scanning Probe Methods XII [electronic resource] : Characterization / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat [editor.] Fuchs, Harald [editor.] SpringerLink (Online service) Series: NanoScience and TechnologyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	11.		Image from Amazon.com	Applied Scanning Probe Methods XIII [electronic resource] : Biomimetics and Industrial Applications / edited by Bharat Bhushan, Harald Fuchs. by Bhushan, Bharat [editor.] Fuchs, Harald [editor.] SpringerLink (Online service) Series: NanoScience and TechnologyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	12.		Image from Amazon.com	Soft matter nanotechnology : from structure to function / edited by Xiaodong Chen and Harald Fuchs. by Chen, Xiaodong [editor.] Fuchs, Harald [editor.] ebrary, Inc Publisher: Weinheim, Germany : Wiley-VCH, 2015Copyright date: copy©2015 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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