Testing for small-delay defects in nanoscale CMOS integrated circuits / edited by Sandeep K. Goel, Krishnendu Chakrabarty.

Contributor(s):

Series: Devices, circuits, and systemsPublisher: Boca Raton, FL : CRC Press, [2014]Copyright date: (copy)2014Description: 1 online resource (xv, 222 pages) : illustrationsContent type:

text

Media type:

computer

Carrier type:

online resource

ISBN:

9781439829424
143982942X

Other title:

Testing for small-delay defects in nanoscale Complementary Metal-Oxide Semiconductor integrated circuits

Subject(s):

Metal oxide semiconductors, Complementary -- Testing

Genre/Form:

Electronic books.

LOC classification:

TK7871.99.M44

Online resources:

Click here to access online

Item type:

eBooks

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Description based on online resource; title from title page (Safari, viewed January 8, 2015).

Includes bibliographical references (pages 208-222).

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