Mechanical stress on the nanoscale [electronic resource] : simulation, material systems and characterization techniques / edited by Margrit Hanb�ucken, Pierre M�uller, and Ralf B. Wehrspohn.
Publication details: Weinheim, Germany : Wiley-VCH, 2011.Description: xxi, 358 p. : ill. (some col.)ISBN:- 9783527410668
- 9783527639564 (e-book)
- QC176.8.N35 M43 2011eb

Includes bibliographical references and index.
pt. 1. Fundamentals of stress and strain on the nanoscale -- pt. 2. Model systems with stress-engineered properties -- pt. 3. Characterization techniques of measuring stresses on the nanoscale.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2015. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.