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Electron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland / edited by Danuta Str�o�z and Krystian Prusik.

By: Contributor(s): Series: Diffusion and defect data. Pt. B, Solid state phenomena ; ; volumes 186.Publisher: Durnten-Zurich, Switzerland ; Enfield, NH, USA : TTP, [2012]Copyright date: �2012Description: 1 online resource (352 pages) : illustrations (some color)Content type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783037853818 (hardback)
  • 9783038136996 (e-book)
Other title:
  • Electron microscopy 14
Subject(s): Genre/Form: Additional physical formats: Print version:: Electron microscopy XIV : selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM2011), June 26-30, 2011, Wisla, Poland.DDC classification:
  • 502.825 23
LOC classification:
  • QH212.E4 I57 2011eb
Online resources:
Item type: eBooks
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Includes bibliographical references and indexes.

Description based on print version record.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2014. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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