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Reliability and radiation effects in compound semiconductors [electronic resource] / Allan Johnston.
Publication details: Hackensack, N.J. : World Scientific, 2010.Description: xii, 363 p. : illISBN:- 981427710X
- 9789814277105
- 9789814277112 (e-book)
- QC611.8.C64 J64 2010eb
eBooks
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Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.