Measurement techniques for radio frequency nanoelectronics / T. Mitch Wallis, Pavel Kabos.

By: Contributor(s): Series: Cambridge RF and microwave engineering seriesPublisher: Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2017Description: 1 online resource (1 volume) : illustrationsContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
Subject(s): Genre/Form: LOC classification:
  • TK6552.5
Online resources:
Item type: eBooks
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Description based on online resource; title from title page (Safari, viewed November 16, 2017).

Includes bibliographical references and index.

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