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	1.		Image from Amazon.com	Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings / edited by Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder. by Yeung, Dit-Yan [editor.] Kwok, James T [editor.] Fred, Ana [editor.] Roli, Fabio [editor.] Ridder, Dick de [editor.] SpringerLink (Online service) Series: Lecture Notes in Computer Science ; 4109Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	2.		Image from Amazon.com	Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshop, SSPR & SPR 2008, Orlando, USA, December 4-6, 2008. Proceedings / edited by Niels da Vitoria Lobo, Takis Kasparis, Fabio Roli, James T. Kwok, Michael Georgiopoulos, Georgios C. Anagnostopoulos, Marco Loog. by Vitoria Lobo, Niels da [editor.] Kasparis, Takis [editor.] Roli, Fabio [editor.] Kwok, James T [editor.] Georgiopoulos, Michael [editor.] Anagnostopoulos, Georgios C [editor.] Loog, Marco [editor.] SpringerLink (Online service) Series: Lecture Notes in Computer Science ; 5342Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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