Journey to data quality [electronic resource] / Yang W. Lee ... [et al.].
Publication details: Cambridge, Mass. : MIT Press, c2006.Description: xii, 226 p. : illISBN:- 0262122871 (alk. paper)
- 9780262122870 (alk. paper)
- 658.4/038 22
- HF5548.2 .J68 2006eb

Includes bibliographical references (p. [215]-221) and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.