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	1.		Image from Amazon.com	Applied logistic regression [electronic resource]. by Hosmer, David W Lemeshow, Stanley Sturdivant, Rodney X ebrary, Inc Series: Wiley series in probability and statistics Edition: 3rd ed. / David W. Hosmer, Stanley Lemeshow, Rodney X. Sturdivant. Publication details: Hoboken, N.J. : Wiley, 2013 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	2.		Image from Amazon.com	Applied logistic regression. by Hosmer, David W Lemeshow, Stanley Sturdivant, Rodney X Wiley eBooks Series: Wiley series in probability and statistics Edition: Third edition / David W. Hosmer, Jr., PhD, Stanley Lemeshow, PhD, Rodney X. Sturdivant, PhD. Publisher: Hoboken, New Jersey : Wiley, [2013] Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	3.		Image from Amazon.com	Applied survival analysis [electronic resource] : regression modeling of time-to-event data / David W. Hosmer, Stanley Lemeshow, Susanne May. by Hosmer, David W Lemeshow, Stanley May, Susanne Safari eBooks Series: Wiley series in probability and statistics Edition: 2nd ed. c2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	4.		Image from Amazon.com	Applied logistic regression [electronic resource] / David W. Hosmer, Stanley Lemeshow, Rodney X. Sturdivant. by Hosmer, David W Lemeshow, Stanley Sturdivant, Rodney X Safari eBooks Series: Wiley series in probability and statistics Edition: 3rd ed. c2013 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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