A practical guide to transmission electron microscopy : fundamentals / Zhiping Luo.
Series: Materials characterization and analysis collectionPublisher: New York, NY : Momentum Press Engineering, 2016Edition: First editionDescription: 1 online resource (1 volume) : illustrationsContent type:- text
- computer
- online resource
- 9781606507049
- 1606507044
- QH212.T7

No physical items for this record
Description based on online resource; title from title page (Safari, viewed December 7, 2015).
Includes bibliographical references and index.