Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie.
Series: Frontiers in electronic testingPublication details: Boston : Kluwer Academic, c2000.Description: xvii, 239 p. : illISBN:- 0792386698 (alk. paper)
- 621.385 21
- TK7874 .D47497 2000eb

Includes bibliographical references.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.