Operational risk management [electronic resource] : a practical approach to intelligent data analysis / edited by Ron S. Kenett, Yossi Raanan.
Publication details: Chichester ; [Hoboken] : John Wiley & Sons, 2010.Description: xxxvii, 285 p. : illISBN:- 9780470747483
- 658.15/5 22
- HD61 .O66 2010eb

Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2010. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.