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	1.		Image from Amazon.com	Thermal and Power Management of Integrated Circuits [electronic resource] / by Arman Vassighi, Manoj Sachdev. by Vassighi, Arman [author.] Sachdev, Manoj [author.] SpringerLink (Online service) Series: Series on Integrated Circuits and SystemsPublisher: Boston, MA : Springer US, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	2.		Image from Amazon.com	Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez. by Sachdev, Manoj [editor.] Gyvez, José Pineda de [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 34Publisher: Boston, MA : Springer US, 2007 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	3.		Image from Amazon.com	ESD Protection Device and Circuit Design for Advanced CMOS Technologies [electronic resource] / by Oleg Semenov, Hossein Sarbishaei, Manoj Sachdev. by Semenov, Oleg [author.] Sarbishaei, Hossein [author.] Sachdev, Manoj [author.] SpringerLink (Online service) Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	4.		Image from Amazon.com	CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev. by Pavlov, Andrei [author.] Sachdev, Manoj [author.] SpringerLink (Online service) Series: Frontiers In Electronic Testing ; 40Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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