Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.

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(14th : International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (14th : 2011 : Miyazaki-shi, Japan)

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Series: Materials science forum ; v. 725.Publisher: Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]Copyright date: �2012Description: 1 online resource (300 pages)Content type:

text

Media type:

computer

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online resource

ISBN:

9783038138563 (e-book)
9783037854426 (pbk.)

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Electronic books.

LOC classification:

QC611.6.D4 I58 2011eb

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Click here to access online

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eBooks

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Electronic reproduction. Palo Alto, Calif. : ebrary, 2013. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.

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