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	1.		Image from Amazon.com	Fault Diagnosis and Tolerance in Cryptography [electronic resource] : Third International Workshop, FDTC 2006, Yokohama, Japan, October 10, 2006. Proceedings / edited by Luca Breveglieri, Israel Koren, David Naccache, Jean-Pierre Seifert. by Breveglieri, Luca [editor.] Koren, Israel [editor.] Naccache, David [editor.] Seifert, Jean-Pierre [editor.] SpringerLink (Online service) Series: Lecture Notes in Computer Science ; 4236Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	2.		Image from Amazon.com	Detection of Intrusions and Malware, and Vulnerability Assessment [electronic resource] : 10th International Conference, DIMVA 2013, Berlin, Germany, July 18-19, 2013. Proceedings / edited by Konrad Rieck, Patrick Stewin, Jean-Pierre Seifert. by Rieck, Konrad [editor.] Stewin, Patrick [editor.] Seifert, Jean-Pierre [editor.] SpringerLink (Online service) Series: Lecture Notes in Computer Science ; 7967Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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