Energy-Efficient Fault-Tolerant Systems [electronic resource] / edited by Jimson Mathew, Rishad A. Shafik, Dhiraj K. Pradhan.
Publisher: New York, NY : Springer New York : Imprint: Springer, 2014Description: XIV, 335 p. 132 illus., 51 illus. in color. online resourceContent type:- text
- computer
- online resource
- 9781461441939
- Engineering
- Renewable energy resources
- Semiconductors
- Physics
- Optics
- Optoelectronics
- Plasmons (Physics)
- Microwaves
- Optical engineering
- Electronic circuits
- Renewable energy sources
- Alternate energy sources
- Green energy industries
- Engineering
- Circuits and Systems
- Semiconductors
- Renewable and Green Energy
- Applied and Technical Physics
- Microwaves, RF and Optical Engineering
- Optics, Optoelectronics, Plasmonics and Optical Devices
- 621.3815 23
- TK7888.4

Evolution of Fault Tolerant Design -- Fault and Reliability Models -- Energy Efficient Design Techniques -- Error Correction Coding -- System-level Reliable Design -- Fault Tolerant -- Finite Field Arithmetic Circuit Design and Testing Techniques -- Reliable Network-on-Chip Architectures -- Energy Efficient Reconfigurable Systems -- Bio-Inspired Online Fault Detection in NoC Interconnect -- Fault-tolerant dynamically reconfigurable NoC-based SoC.
This book describes the state-of-the-art in energy efficient, fault-tolerant embedded systems. It covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches. Readers will be enabled to meet the conflicting design objectives of energy efficiency and fault-tolerance for reliability, given the up-to-date techniques presented. · Provides embedded systems designers with state-of-the-art solutions to the conflicting problems of energy efficiency and fault-tolerance for reliability; · Covers the entire product lifecycle of electronic systems design, analysis and testing and includes discussion of both circuit and system-level approaches; · Includes discussion of emerging issues related to technology scaling, next generation memory and logic design.