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Zinc Oxide — A Material for Micro- and Optoelectronic Applications [electronic resource] / edited by Norbert H. Nickel, Evgenii Terukov.

Contributor(s): Series: NATO Science Series II: Mathematics, Physics and Chemistry ; 194Publisher: Dordrecht : Springer Netherlands, 2005Description: XVI, 240 p. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9781402034756
Subject(s): Genre/Form: Additional physical formats: Printed edition:: No titleDDC classification:
  • 621.36 23
LOC classification:
  • QC350-467
  • TA1501-1820
  • QC392-449.5
  • TA1750-1750.22
Online resources:
Contents:
ZnO Bulk and Layer Growth -- The Scope of Zinc Oxide Bulk Growth -- Growth Mechanism of ZnO Layers -- Kinetics of High-Temperature Defect Formation in ZnO in the Stream of Oxygen Radicals -- Electrical, Optical, and Structural Properties -- Electrical Properties of ZnO -- Electrical Properties of ZnO Thin Films and Single Crystals -- Structure, Morphology, and Photoluminescence of ZnO Films -- Optics and Spectroscopy of Point Defects in ZnO -- Whispering Gallery Modes in Hexagonal Zinc Oxide Micro- and Nanocrystals -- Properties of Dislocations in Epitaxial ZnO Layers Analyzed by Transmission Electron Microscopy -- Role of Hydrogen -- Muon Spin Rotation Measurements on Zinc Oxide -- Hydrogen Donors in Zinc Oxide -- Hydrogen-Related Defects in ZnO Studied by IR Absorption Spectroscopy -- Influence of the Hydrogen Concentration on H Bonding in Zinc Oxide -- Fundamental Properties -- Valence Band Ordering and Magneto-Optical Properties of Free and Bound Excitons in ZnO -- Fundamental Optical Spectra and Electronic Structure of ZnO Crystals -- Photo-Induced Localized Lattice Vibrations in ZnO Doped with 3d Transition Metal Impurities -- Device Applications -- ZnO Window Layers for Solar Cells -- ZnO/AlGaN Ultraviolet Light Emitting Diodes -- ZnO Transparent Thin-Film Transistor Device Physics -- Zinc Oxide Thin-Film Transistors.
In: Springer eBooksSummary: Recently, a significant effort has been devoted to the investigation of ZnO as a suitable semiconductor for UV light-emitting diodes, lasers, and detectors and hetero-substrates for GaN. Research is driven not only by the technological requirements of state-of-the-art applications but also by the lack of a fundamental understanding of growth processes, the role of intrinsic defects and dopants, and the properties of hydrogen. The NATO Advanced Research Workshop on “Zinc oxide as a material for micro- and optoelectronic applications”, held from June 23 to June 25 2004 in St. Petersburg, Russia, was organized accordingly and started with the growth of ZnO. A variety of growth methods for bulk and layer growth were discussed. These techniques comprised growth methods such as closed space vapor transport (CSVT), metal-organic chemical vapor deposition, reactive ion sputtering, and pulsed laser deposition. From a structural point of view using these growth techniques ZnO can be fabricated ranging from single crystalline bulk material to polycrystalline ZnO and nanowhiskers. A major aspect of the ZnO growth is doping. n-type doping is relatively easy to accomplish with elements such al Al or Ga. At room temperature single crystal ZnO exhibits a resistivity of about 0. 3 -cm, an electron mobility of 2 17 -3 225 cm /Vs, and a carrier concentration of 10 cm . In n-type ZnO two shallow donors are observable with activation energies of 30 – 40 meV and 60 – 70 meV.
Item type: eBooks
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ZnO Bulk and Layer Growth -- The Scope of Zinc Oxide Bulk Growth -- Growth Mechanism of ZnO Layers -- Kinetics of High-Temperature Defect Formation in ZnO in the Stream of Oxygen Radicals -- Electrical, Optical, and Structural Properties -- Electrical Properties of ZnO -- Electrical Properties of ZnO Thin Films and Single Crystals -- Structure, Morphology, and Photoluminescence of ZnO Films -- Optics and Spectroscopy of Point Defects in ZnO -- Whispering Gallery Modes in Hexagonal Zinc Oxide Micro- and Nanocrystals -- Properties of Dislocations in Epitaxial ZnO Layers Analyzed by Transmission Electron Microscopy -- Role of Hydrogen -- Muon Spin Rotation Measurements on Zinc Oxide -- Hydrogen Donors in Zinc Oxide -- Hydrogen-Related Defects in ZnO Studied by IR Absorption Spectroscopy -- Influence of the Hydrogen Concentration on H Bonding in Zinc Oxide -- Fundamental Properties -- Valence Band Ordering and Magneto-Optical Properties of Free and Bound Excitons in ZnO -- Fundamental Optical Spectra and Electronic Structure of ZnO Crystals -- Photo-Induced Localized Lattice Vibrations in ZnO Doped with 3d Transition Metal Impurities -- Device Applications -- ZnO Window Layers for Solar Cells -- ZnO/AlGaN Ultraviolet Light Emitting Diodes -- ZnO Transparent Thin-Film Transistor Device Physics -- Zinc Oxide Thin-Film Transistors.

Recently, a significant effort has been devoted to the investigation of ZnO as a suitable semiconductor for UV light-emitting diodes, lasers, and detectors and hetero-substrates for GaN. Research is driven not only by the technological requirements of state-of-the-art applications but also by the lack of a fundamental understanding of growth processes, the role of intrinsic defects and dopants, and the properties of hydrogen. The NATO Advanced Research Workshop on “Zinc oxide as a material for micro- and optoelectronic applications”, held from June 23 to June 25 2004 in St. Petersburg, Russia, was organized accordingly and started with the growth of ZnO. A variety of growth methods for bulk and layer growth were discussed. These techniques comprised growth methods such as closed space vapor transport (CSVT), metal-organic chemical vapor deposition, reactive ion sputtering, and pulsed laser deposition. From a structural point of view using these growth techniques ZnO can be fabricated ranging from single crystalline bulk material to polycrystalline ZnO and nanowhiskers. A major aspect of the ZnO growth is doping. n-type doping is relatively easy to accomplish with elements such al Al or Ga. At room temperature single crystal ZnO exhibits a resistivity of about 0. 3 -cm, an electron mobility of 2 17 -3 225 cm /Vs, and a carrier concentration of 10 cm . In n-type ZnO two shallow donors are observable with activation energies of 30 – 40 meV and 60 – 70 meV.

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