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ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by
Publication details: Materials Park, OH : Asm International, c2008
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  • Proceedings of the 34th International Symposium for Testing and Failure Analysis
  • 34th International Symposium for Testing and Failure Analysis
  • Thirty-fourth International Symposium for Testing and Failure Analysis
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Practical guide to image analysis [electronic resource]. by
Publication details: Materials Park, OH : ASM International, c2000
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ISTFA 2002 [electronic resource] : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. / sponsored by EDFAS, ISTFA. by
Publication details: Materials Park, OH : ASM International, 2002
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  • Proceedings of the 28th International Symposium for Testing and Failure Analysis
  • Conference proceedings from the 28th International Symposium for Testing and Failure Analysis
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Protective coatings for turbine blades [electronic resource] / Y. Tamarin. by
Publication details: Materials Park, OH : ASM International, c2002
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ISTFA 2007 [electronic resource] : proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2007, ASM International. by
Publication details: Materials Park, OH : ASM International, c2007
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  • Proceedings of the 33rd International Symposium for Testing and Failure Analysis
  • 33rd International Symposium for Testing and Failure Analysis
  • Thirty-third International Symposium for Testing and Failure Analysis
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ISTFA 2000 [electronic resource] : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. by
Publication details: Materials Park, OH : ASM International, c2000
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  • Proceedings of the 26th International Symposium or Testing and Failure Analysis
  • Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis
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