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	1.		Image from Amazon.com	Simulation of Semiconductor Processes and Devices 2007 [electronic resource] : SISPAD 2007 / edited by Tibor Grasser, Siegfried Selberherr. by Grasser, Tibor [editor.] Selberherr, Siegfried [editor.] SpringerLink (Online service) Publisher: Vienna : Springer Vienna, 2007 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	2.		Image from Amazon.com	Hot Carrier Degradation in Semiconductor Devices [electronic resource] / edited by Tibor Grasser. by Grasser, Tibor [editor.] SpringerLink (Online service) Publisher: Cham : Springer International Publishing : Imprint: Springer, 2015 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	3.		Image from Amazon.com	Bias Temperature Instability for Devices and Circuits [electronic resource] / edited by Tibor Grasser. by Grasser, Tibor [editor.] SpringerLink (Online service) Publisher: New York, NY : Springer New York : Imprint: Springer, 2014 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
	4.		Image from Amazon.com	Organic Electronics [electronic resource] / edited by Tibor Grasser, Gregor Meller, Ling Li. by Grasser, Tibor [editor.] Meller, Gregor [editor.] Li, Ling [editor.] SpringerLink (Online service) Series: Advances in Polymer Science ; 223Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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