Results of search for 'ccl=su:{Diffraction.}'

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1.	Image from Amazon.com	Two-dimensional X-ray diffraction [electronic resource] / Bob B. He. by He, Bob B, 1954- ebrary, Inc Publication details: Hoboken, NJ : Wiley, c2009 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
2.	Image from Amazon.com	Applied digital optics [electronic resource] : micro-optics, optical MEMS, and nanophotonics / Bernard Kress, Patrick Meyrueis. by Kress, B Meyrueis, Patrick ebrary, Inc Publication details: Chichester, West Sussex, U.K. ; Hoboken, N.J. : Wiley, 2009 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
3.	Image from Amazon.com	Neutron diffraction [electronic resource] principles, instrumentation and applications / Xinzhe Jin, editor. by Jin, Xinzhe ebrary, Inc Series: Materials science and technologies series Publication details: New York : Novinka, c2013 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
4.	Image from Amazon.com	Ring interferometry / Grigorii B. Malykin, Vera I. Pozdnyakove, translated by Alexei Zhurov. by Malykin, Grigorii B Pozdnyakova, Vera I Zhurov, Alexei ebrary, Inc Series: De Gruyter studies in mathematical physicsPublisher: Berlin : De Gruyter, 2013Copyright date: �2013 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
5.	Image from Amazon.com	Direct and inverse problems in wave propagation and applications / edited by Ivan Graham [and three others]. by Graham, Ivan G ebrary, Inc Publisher: Berlin ; Boston : Walter de Gruyter GmbH & Company, [2013]Copyright date: �2013 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
6.		Extending the reach of powder diffraction modelling by user defined macros : special topic volume with invited peer reviewed papers only / edited by: Paolo Scardi and Robert E. Dinnebier. by Scardi, P. (Paolo) Dinnebier, Robert E ebrary, Inc Series: Materials science forum ; v. 651.Publisher: Stafa-Zurich, Switzerland ; Enfield, New Hampshire : Trans Tech, 2010Copyright date: �2010 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
7.	Image from Amazon.com	X-ray and related techniques : selected, peer reviewed papers of the International Conference on X-ray and Related Techniques in Research and Industry (IXCRI 2010) held at Langkawi Island, Malaysia from 9th to 10th of June 2010 / edited by Zainal Arifin Ahmad [and six others]. by International Conference on X-ray and Related Techniques in Research and Industry (2010 : Langkawi Island, Kedah) Zainal Arifin Ahmad ebrary, Inc Series: Advanced materials research ; 173.Publisher: Stafa-Zurich, Switzerland : Trans Tech Publications, [2011]Copyright date: �2011 Other title: International Conference on X-ray and Related Techniques in Research and Industry ICXRI 2010 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
8.	Image from Amazon.com	Fundamentals of the physical theory of diffraction / Pyotr Ya. Ufimtsev. by Ufim�t�sev, P. �I�A. (Petr �I�Akovlevich) [author.] ebrary, Inc Edition: Second edition. Publisher: Hoboken, New Jersey : IEEE : Wiley, 2014Copyright date: �2014 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
9.	Image from Amazon.com	Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. by Serv�in, Manuel [author.] Quiroga, J. Antonio [author.] Padilla, J. Moises [author.] ebrary, Inc Publisher: Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014Copyright date: �2014 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
10.	Image from Amazon.com	Structure from diffraction methods / edited by Duncan W. Bruce, Dermot O'Hare, Richard I. Walton. by Bruce, Duncan W [editor.] O'Hare, Dermot [editor.] Walton, Richard I [editor.] ebrary, Inc Series: Inorganic materials seriesPublisher: West Sussex, England : John Wiley & Sons, Ltd., 2014Copyright date: �2014 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
11.	Image from Amazon.com	Applications of neutron powder diffraction [electronic resource] / Erich H. Kisi, Christopher J. Howard. by Kisi, Erich H Howard, Christopher J Oxford eBooks Series: Oxford series on neutron scattering in condensed matter ; 15. Publication details: Oxford : Oxford University Press, 2008 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
12.	Image from Amazon.com	Coherent x-ray optics [electronic resource] / David M. Paganin. by Paganin, David M Oxford eBooks Series: Oxford series on synchrotron radiation ; no. 6. Publication details: Oxford : Oxford University Press, 2006 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
13.	Image from Amazon.com	Quantum and optical dynamics of matter for nanotechnology / by Mihai V. Putz. by Putz, Mihai V [author.] IGI eBooks IGI Global [publisher.] Publisher: Hershey, Pennsylvania (701 E. Chocolate Avenue, Hershey, Pa., 17033, USA) : IGI Global, [2014] Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
14.	Image from Amazon.com	X-ray line profile analysis in materials science / Jeno Gubicza. by Gubicza, Jeno, 1969- [author.] IGI eBooks IGI Global [publisher.] Publisher: Hershey, Pennsylvania (701 E. Chocolate Avenue, Hershey, PA 17033, USA) : IGI Global, [2014] Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
15.	Image from Amazon.com	High resolution X-ray diffractometry and topography [electronic resource] / D. Keith Bowen and Brian K. Tanner. by Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith) T&F eBooks Publication details: London ; Bristol, Pa. : Taylor & Francis, c1998 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
16.	Image from Amazon.com	Iterative methods for diffractive optical elements computation [electronic resource] / Victor Soifer, Victor Kotlyar and Leonid Doskolovich. by Soĭfer, V. A. (Viktor Aleksandrovich) Kotlyar, Victor Doskolovich, Leonid T&F eBooks Publication details: London : Taylor & Francis, c1997 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
17.	Image from Amazon.com	Introduction to X-ray powder diffractometry / Ron Jenkins, Robert L. Snyder. by Jenkins, Ron, 1932- Snyder, R. L. (Robert L.), 1941- Wiley eBooks Series: Chemical analysis ; v. 138. Publication details: New York : Wiley, ©1996 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
18.	Image from Amazon.com	X-rays and materials / edited by Philippe Goudeau, René Guinebretière. by Goudeau, Philippe Guinebretière, René Wiley eBooks Series: ISTE Publication details: London : Hoboken, NJ : Iste ; Wiley, 2012 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
19.	Image from Amazon.com	Modern diffraction methods / edited by Eric J. Mittemeijer and Udo Welzel. by Mittemeijer, E. J Welzel, Udo Wiley eBooks Publication details: Weinheim : Wiley-VCH, ©2013 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
20.	Image from Amazon.com	Fundamentals of the physical theory of diffraction / Pyotr Ya. Ufimtsev. by Ufimt︠s︡ev, P. I︠A︡. (Petr I︠A︡kovlevich) Wiley eBooks Edition: 2e. Language: English Original language: Russian Publisher: Hoboken, New Jersey : John Wiley & Sons Inc., [2014] Online resources: Click here to access online Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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