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1.	Image from Amazon.com	Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie. by Nadeau-Dostie, Benoit ebrary, Inc Series: Frontiers in electronic testing Publication details: Boston : Kluwer Academic, c2000 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
2.	Image from Amazon.com	A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud. by Stroud, Charles E ebrary, Inc Series: Frontiers in electronic testing Publication details: Boston : Kluwer Academic Publishers, c2002 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
3.	Image from Amazon.com	Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi. by Nicolici, Nicola Al-Hashimi, Bashir ebrary, Inc Series: Frontiers in electronic testing ; 22. Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
4.	Image from Amazon.com	High performance memory testing [electronic resource] : design principles, fault modeling, and self-test / R. Dean Adams. by Adams, R. Dean ebrary, Inc Series: Frontiers in electronic testing Publication details: Boston : Kluwer Academic, c2003 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
5.	Image from Amazon.com	Boundary-scan interconnect diagnosis [electronic resource] / Jos�e T. de Sousa, Peter Y.K. Cheung. by Sousa, Jos�e T. de Cheung, Peter Y. K ebrary, Inc Series: Frontiers in electronic testing ; 18. Publication details: Boston : Kluwer Academic Publishers, c2001 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
6.	Image from Amazon.com	Fault injection techniques and tools for embedded systems reliability evaluation [electronic resource] / edited by Alfredo Benso and Paolo Prinetto. by Benso, Alfredo Prinetto, Paolo ebrary, Inc Series: Frontiers in electronic testing ; 23. Publication details: Boston : Kluwer Academic Publishers, c2003 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
7.	Image from Amazon.com	Verification by error modeling [electronic resource] : using testing techniques in hardware verification / written by Katarzyna Radecka, Zeljko Zilic. by Radecka, Katarzyna Zilic, Zeljko ebrary, Inc Series: Frontiers in electronic testing ; 25. Publication details: Boston : Kluwer Academic Publishers, 2003 Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
8.	Image from Amazon.com	Introduction to Advanced System-on-Chip Test Design and Optimization [electronic resource] / by Erik Larsson. by Larsson, Erik [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 29Publisher: Boston, MA : Springer US, 2005 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
9.	Image from Amazon.com	Fault Diagnosis of Analog Integrated Circuits [electronic resource] / by Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha. by Kabisatpathy, Prithviraj [author.] Barua, Alok [author.] Sinha, Satyabroto [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 30Publisher: Boston, MA : Springer US, 2005 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
10.	Image from Amazon.com	Data Mining and Diagnosing IC Fails [electronic resource] / by Leendert M. Huisman. by Huisman, Leendert M [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 31Publisher: Boston, MA : Springer US, 2005 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
11.	Image from Amazon.com	Gizopoulos / Advances in ElectronicTesting [electronic resource] / edited by Dimitris Gizopoulos. by Gizopoulos, Dimitris [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 27Publisher: Boston, MA : Springer US, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
12.	Image from Amazon.com	Digital Timing Measurements [electronic resource] : From Scopes and Probes to Timing and Jitter / by Wolfgang Maichen. by Maichen, Wolfgang [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 33Publisher: Boston, MA : Springer US, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
13.	Image from Amazon.com	The Core Test Wrapper Handbook [electronic resource] : Rationale and Application of IEEE Std. 1500™ / by Francisco da Silva, Teresa McLaurin, Tom Waayers. by Silva, Francisco da [author.] McLaurin, Teresa [author.] Waayers, Tom [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 35Publisher: Boston, MA : Springer US, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
14.	Image from Amazon.com	Oscillation-Based Test in Mixed-Signal Circuits [electronic resource] / by Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz. by Sánchez, Gloria Huertas [author.] García de la Vega, Diego Vázquez [author.] Rueda, Adoración Rueda [author.] Díaz, José Luis Huertas [author.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 36Publisher: Dordrecht : Springer Netherlands, 2006 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
15.	Image from Amazon.com	Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, José Pineda de Gyvez. by Sachdev, Manoj [editor.] Gyvez, José Pineda de [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 34Publisher: Boston, MA : Springer US, 2007 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
16.	Image from Amazon.com	Emerging Nanotechnologies [electronic resource] : Test, Defect Tolerance, and Reliability / edited by Mohammad Tehranipoor. by Tehranipoor, Mohammad [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 37Publisher: Boston, MA : Springer US, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
17.	Image from Amazon.com	CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies [electronic resource] : Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev. by Pavlov, Andrei [author.] Sachdev, Manoj [author.] SpringerLink (Online service) Series: Frontiers In Electronic Testing ; 40Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
18.	Image from Amazon.com	New Methods of Concurrent Checking [electronic resource] / by Michael Göessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld. by Göessel, Michael [author.] Ocheretny, Vitaly [author.] Sogomonyan, Egor [author.] Marienfeld, Daniel [author.] SpringerLink (Online service) Series: Frontiers In Electronic Testing ; 42Publisher: Dordrecht : Springer Netherlands, 2008 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
19.	Image from Amazon.com	Soft Errors in Modern Electronic Systems [electronic resource] / edited by Michael Nicolaidis. by Nicolaidis, Michael [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 41Publisher: Boston, MA : Springer US : Imprint: Springer, 2011 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)
20.	Image from Amazon.com	Models in Hardware Testing [electronic resource] : Lecture Notes of the Forum in Honor of Christian Landrault / edited by Hans-Joachim Wunderlich. by Wunderlich, Hans-Joachim [editor.] SpringerLink (Online service) Series: Frontiers in Electronic Testing ; 43Publisher: Dordrecht : Springer Netherlands, 2010 In: Springer eBooks Online resources: Click here to access online Availability: No items available. Place hold Save to lists Add to cart (remove)

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Your search returned 20 results.